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A Nine-Valued Circuit Model for Test Generation

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1 Author(s)
Muth, P. ; Brown, Boveri, and Cie AG

A nine-valued circuit model for test generation is introduced which takes care of multiple and repeated effects of a fault in sequential circuits. Using this model test sequences can be determined which allow multiple and repeated effects of faults on the internal state of a sequential circuit. Thus valid test sequences are derived where other known procedures, like the D-algorithm, do not find any test although one exists.

Published in:

Computers, IEEE Transactions on  (Volume:C-25 ,  Issue: 6 )

Date of Publication:

June 1976

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