By Topic

Matrix Transformations for N-Tuple Analysis of Binary Patterns

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ratz, H.C. ; Department of Electrical Engineering, University of Waterloo

The frequency of occurrence of logic functions of binary N-tuples can be observed from sequences of binary patterns. The logic functions considered here are AND, NOR, NAND, OR, and an odd-even parity check; and the frequency parameters are expressed as real matrix transformations on the probabilities of the patterns. Some properties, inverses, and interrelationships among the parameter sets are given, along with fast algorithms to facilitate computational processes. The results permit the outputs of convenient hardware logic operations to be converted into other parameters for smoothing, detection, or inference purposes, or to estimate the pattern probabilities by inversion. A measure of association among binary patterns is given as one characteristic feature which can be derived from the observed parameters.

Published in:

Computers, IEEE Transactions on  (Volume:C-25 ,  Issue: 5 )