By Topic

A modified Kanban system in a semiconductor manufacturing environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Otenti, S. ; Digital Equipment Corp., Hudson, MA, USA

The author discusses a modified Kanban WIP (work in process) control system successfully implemented in a CMOS fabrication facility. The fundamental problem this system was designed to prevent uneven line loading resulting from various operational problems. Even after a problem had been resolved, the residual impact on production due to disrupted WIP flow could last for weeks. Thus, poor line loading led directly to increased cycletimes, poor predictability, and more manufacturing mistakes. The goal of the Kanban system was to minimize queue time by delivering WIP to each operation only when the operation was ready to process it. Unfortunately, a conceptually pure Kanban system will not work in a semiconductor fabrication area due to the nature of the manufacturing process. Thus, if the Kanban concept was to be effective in a fab environment it had to be modified to take these factors into account. These modifications and the system used to control the line are discussed in detail

Published in:

Advanced Semiconductor Manufacturing Conference and Workshop, 1991. ASMC 91 Proceedings. IEEE/SEMI 1991

Date of Conference:

21-23 Oct 1991