Scheduled System Maintenance:
On Monday, April 27th, IEEE Xplore will undergo scheduled maintenance from 1:00 PM - 3:00 PM ET (17:00 - 19:00 UTC). No interruption in service is anticipated.
By Topic

Electronic system reliability: collating prediction models

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Goel, A. ; Dept. of Decision Sci. & Eng. Syst., Rensselaer Polytech. Inst., Troy, NY ; Graves, R.J.

This paper summarizes research done in the area of electronic system reliability and assesses the approaches used in the calculation of electronic system failure rates. A detailed literature survey is conducted to investigate the various available reliability prediction models. The paper starts with a definition of reliability, briefly discusses various regions of system failure rate in time, justifies the role of reliability prediction methods, provides a historical overview, classifies the traditional models into easy to understand categories and discusses the advantages and disadvantage, reviews the key models that are currently in use, and compares the first and most widely used model (i.e., MIL-HDBK-217) with the most recently introduced model (i.e., PRISM)

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:6 ,  Issue: 2 )