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Improvement of aging simulation of electronic circuits using behavioral modeling

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5 Author(s)
Marc, F. ; Lab. IXL, Univ. Bordeaux, Talence ; Mongellaz, B. ; Bestory, C. ; Levi, H.
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This paper presents an original method of analog circuits aging simulation. This method is based on a behavioral modelling of circuits that includes the effects of degradations on circuit parameters, on the basis of transistors aging. The efficiency of the method is demonstrated in the case of hot carriers degradation in an amplifier

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Device and Materials Reliability, IEEE Transactions on  (Volume:6 ,  Issue: 2 )