Close category search window
 

Maximum contrast beamformer for electromagnetic mapping of brain activity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Yong-Sheng Chen ; Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu ; Chih-Yu Cheng ; Jen-Chuen Hsieh ; Li-Fen Chen

Beamforming technique can be applied to map the neuronal activities from magnetoencephalographic/electroencephalographic (MEG/EEG) recordings. One of the major difficulties of the scalar-type MEG/EEG beamformer is the determination of accurate dipole orientation, which is essential to an effective spatial filter. This paper presents a new beamforming technique which exploits a maximum contrast criterion to maximize the ratio of the neuronal activity estimated in a specified active state to the activity estimated in a control state. This criterion leads to a closed-form solution of the dipole orientation. Experiments with simulation, phantom, and finger-lifting data clearly demonstrate the effectiveness, efficiency, and accuracy of the proposed method

Published in:
Biomedical Engineering, IEEE Transactions on  (Volume:53 ,  Issue: 9 )

Date of Publication: Sept. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.