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An Algorithm for the Generation of Test Sets for Combinational Logic Networks

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1 Author(s)

An algorithm is developed for generating a single-fault detection test set to be used in a combinational logic network. This algorithm has two unique characteristics. 1) When a test is generated, a list of faults detected by this test is available. Fault simulation, therefore, is not required after the test has been generated. 2) It generates a test set rather than a single test. Each test, with the exception of the first one, is based on a previous test. Repetition of effort and overlapped coverage of faults for different test generations are thus reduced.

Published in:

Computers, IEEE Transactions on  (Volume:C-24 ,  Issue: 7 )

Date of Publication:

July 1975

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