Cart (Loading....) | Create Account
Close category search window
 

An Approach to the Diagnosis of Intermittent Faults

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Kamal, S. ; Computer Science Section, Department of Mathematics, Wayne State University

A procedure for the diagnosis of intermittent faults in combinational circuits is suggested. This procedure employs a probabilistic model for intermittent failures and presumes that a detection experiment has been run. The circuit is assumed to be irredundant and to possess a single fault out of n possible ones. The approach suggested is based on the repeated application of tests that test for these faults had their effect been permanent. A subset of the test set is selected and is repeatedly applied until a failure is observed. Similar subexperiments are then run with appropriate test subsets until the highest diagnostic resolution is obtained. The expected length of the diagnosis experiment is guaranteed to be finite. This is shown by proving that the expected length of each subexperiment is finite. The diagnosis experiment can be terminated, when any preset time limit is exceeded, compromising the obtained diagnostic resolution. Local symmetry of the fault table is found to be the necessary and sufficient condition for maximum diagnostic resolution.

Published in:

Computers, IEEE Transactions on  (Volume:C-24 ,  Issue: 5 )

Date of Publication:

May 1975

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.