By Topic

Detection oF Pattern-Sensitive Faults in Random-Access Memories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Hayes, J.P. ; Department of Electrical Engineering and the Computer Science Program, University of Southern California

Some formal models for pattern-sensitive faults (PSF's) in random-access memories are presented. The problem of detecting unrestricted PSF's is that of constructing a checking sequence for the memory. An efficient procedure for constructing such a checking sequence is presented. A local PSF is defined as a PSF where the faulty behavior of a memory cell Cidepends on a fixed group of cells called the neighborhood of Ci. Neighborhoods are divided into two classes, open and closed. Test generation methods are described for local PSF's defined on both open and closed neighborhoods. The detection of PSF's when only one memory cell is faulty (single PSF's) is also discussed.

Published in:

Computers, IEEE Transactions on  (Volume:C-24 ,  Issue: 2 )