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An Examination of Algebraic Test Generation Methods for Multiple Faults

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3 Author(s)
B. D. Carroll ; Department of Electrical Engineering, Auburn University ; H. G. Shah ; D. M. Jones

A generalized test function (GTF) is derived that gives all tests for a multiple stuck-at fault in a combinational logic circuit. The GTF is then used as the basis for an examination of several algebraic test generation methods that have appeared in the literature. Deficiencies are found in some methods.

Published in:

IEEE Transactions on Computers  (Volume:C-23 ,  Issue: 7 )