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Easily Testable Cellular Realizations for the (Exactly P)-out-of n and (p or More)-out-of n Logic Functions

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2 Author(s)
Reddy, S.M. ; Department of Electrical Engineering, University of Iowa ; Wilson, J.R.

Networks to realize all n-variable symmetric threshold functions and elementary symmetric functions are given. It is also shown that only 2n test inputs are necessary and sufficient to test any number of faults in these networks.

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Computers, IEEE Transactions on  (Volume:C-23 ,  Issue: 1 )