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Multiple-Fault Detection and Location in Fan-Out Free Combinational Circuits

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2 Author(s)
Fantauzzi, G. ; Società Italiana Telecomunicazioni Siemens ; Marsella, A.

Two algorithms are presented for the detection and location of single or multiple stuck faults in a fan-out free combinational circuit. The algorithms are based on a canonic representation of the indistinguishability classes of faults. The number of tests required in these algorithms are shown to be a linear function of the number of gates in the circuit.

Published in:

Computers, IEEE Transactions on  (Volume:C-23 ,  Issue: 1 )

Date of Publication:

Jan. 1974

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