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Multiple Fault Detection in Combinational Circuits: Algorithms and Computational Results

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2 Author(s)
Du, Min-Wen ; College of Engineering, National Chiao Tung University ; Weiss, C.Dennis

A new approach is developed for finding multiple fault detection tests under quite arbitrary fault models. Computational results are reported and discussed.

Published in:

Computers, IEEE Transactions on  (Volume:C-22 ,  Issue: 3 )

Date of Publication:

March 1973

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