By Topic

A Nonlinear Feature Extraction Algorithm Using Distance Transformation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Koontz, Warren L.G. ; Bell Telephone Laboratories, Inc. ; Fukunaga, K.

Feature extraction has been recognized as a useful technique for pattern recognition. Feature extraction is accomplished by constructing a mapping from the measurement space to a feature space. Often, the mapping is chosen from an arbitrarily specified parametric family by optimizing the parameters with respect to a separability criterion.

Published in:

Computers, IEEE Transactions on  (Volume:C-21 ,  Issue: 1 )