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Projection-based approach to image analysis: pattern recognition and representation in the position-orientation space

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3 Author(s)
Greenspan, H. ; Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel ; Porat, M. ; Zeevi, Y.Y.

A method for image analysis, based on the formalism of functional analysis is proposed. This approach, which is employed for pattern recognition in the combined position-orientation space, is motivated by a variety of neurophysiological findings that emphasize the importance of the orientation feature in visual image processing and analysis. The approach is applied to the so-called Glass patterns, which are special cases of images characterized uniquely by their orientational feature of local correlations between pairs of corresponding dots. The approach can be of interest in the analysis of optical flow

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:14 ,  Issue: 11 )