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Crosstalk modeling for coupled RLC interconnects with application to shield insertion

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2 Author(s)
Junmou Zhang ; Dept. of Electr. & Comput. Eng., Rochester Univ., NY ; Friedman, E.G.

On-chip interconnect delay and crosstalk noise have become significant bottlenecks in the performance and signal integrity of deep submicrometer VLSI circuits. A crosstalk noise model for both identical and nonidentical coupled resistance-inductance-capacitance (RLC) interconnects is developed based on a decoupling technique exhibiting an average error of 6.8% as compared to SPICE. The crosstalk noise model, together with a proposed concept of effective mutual inductance, is applied to evaluate the effectiveness of the shielding technique

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Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:14 ,  Issue: 6 )