Cart (Loading....) | Create Account
Close category search window
 

Automatic linearity and frequency response tests with built-in pattern generator and analyzer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Fa Dai, F. ; Dept. Electr. & Comput. Eng., Auburn Univ., AL ; Stroud, C. ; Dayu Yang

We present a built-in self-test (BIST) approach based on a direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. A main contribution of this paper is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) and frequency response, including both phase and gain. The approach has been implemented in Verilog and synthesized into a field-programmable gate array (FPGA), where it was used for functional testing of an actual device under test (DUT) and compared to simulation results

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:14 ,  Issue: 6 )

Date of Publication:

June 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.