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Automatic linearity and frequency response tests with built-in pattern generator and analyzer

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3 Author(s)
Fa Dai, F. ; Dept. Electr. & Comput. Eng., Auburn Univ., AL ; Stroud, C. ; Dayu Yang

We present a built-in self-test (BIST) approach based on a direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. A main contribution of this paper is the BIST-based hardware implementation and measurement of amplifier linearity (IP3) and frequency response, including both phase and gain. The approach has been implemented in Verilog and synthesized into a field-programmable gate array (FPGA), where it was used for functional testing of an actual device under test (DUT) and compared to simulation results

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:14 ,  Issue: 6 )

Date of Publication:

June 2006

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