By Topic

Formal methods for protocol testing: a detailed study

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sidhu, D. ; Dept. of Comput. Sci., Maryland Univ., Baltimore, MD, USA ; Leung, T.-K.

The authors present a detailed study of four formal methods (T-, U-, D-, and W-methods) for generating test sequences for protocols. Applications of these methods to the NBS Class 4 Transport Protocol are discussed. An estimation of fault coverage of four protocol-test-sequence generation techniques using Monte Carlo simulation is also presented. The ability of a test sequence to decide whether a protocol implementation conforms to its specification heavily relies on the range of faults that it can capture. Conformance is defined at two levels, namely, weak and strong conformance. This study shows that a test sequence produced by T-method has a poor fault detection capability, whereas test sequences produced by U-, D-, and W-methods have comparable (superior to that for T-method) fault coverage on several classes of randomly generated machines used in this study. Also, some problems with a straightforward application of the four protocol-test-sequence generation methods to real-world communication protocols are pointed out

Published in:

Software Engineering, IEEE Transactions on  (Volume:15 ,  Issue: 4 )