Close category search window
 

Millimeter-wave detection of localized anomalies in the space shuttle external fuel tank insulating foam

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kharkovsky, S. ; Dept. of Electr. & Comput. Eng., Univ. of Missouri-Rolla, Rolla, MO, USA ; Case, J.T. ; Abou-Khousa, M.A. ; Zoughi, R.
more authors

The Space Shuttle Columbia's catastrophic accident emphasizes the growing need for developing and applying effective, robust, and life-cycle-oriented nondestructive testing (NDT) methods for inspecting the shuttle external fuel tank spray on foam insulation (SOFI). Millimeter-wave NDT techniques were one of the methods chosen for evaluating their potential for inspecting these structures. Several panels with embedded anomalies (mainly voids) were produced and tested for this purpose. Near-field and far-field millimeter-wave NDT methods were used for producing images of the anomalies in these panels. This paper presents the results of an investigation for the purpose of detecting localized anomalies in several SOFI panels. To this end, continuous-wave reflectometers at single frequencies of 33.5, 70, or 100 GHz representing a relatively wide range of millimeter-wave spectrum [Ka-band (26.5-40 GHz) to W-band (75-110 GHz)] and utilizing different types of radiators were employed. The resulting raw images revealed a significant amount of information about the interior of these panels. However, using simple image processing techniques, the results were improved in particular as it relates to detecting the smaller anomalies. This paper presents the results of this investigation and a discussion of these results.

Published in:
Instrumentation and Measurement, IEEE Transactions on  (Volume:55 ,  Issue: 4 )

Date of Publication: Aug. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.