By Topic

Enhanced sensitivity cross-correlation method for voltage noise measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Crupi, F. ; Dipt. di Elettronica Informatica e Sistemistica, Univ. of Calabria, Arcavacata Di Rende ; Giusi, G. ; Ciofi, C. ; Pace, C.

Ultralow noise measurements often require the application of signal processing and correction techniques to go beyond the noise performances of front-end amplifiers. In this paper, a new method for the voltage noise measurement is proposed, which allows, at least in principle, the complete elimination of the noise introduced by the amplifiers used for the measurements. This is obtained by resorting to the conventional cross-correlation technique for the elimination of the contribution of the equivalent input voltage noise of the amplifiers and by using a new three-step-measurement procedure that exploits different amplifier-configuration measurements in order to subtract the contribution of the equivalent input current noise of the amplifiers

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:55 ,  Issue: 4 )