Cart (Loading....) | Create Account
Close category search window

Unit tests reloaded: parameterized unit testing with symbolic execution

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tillmann, N. ; Microsoft Res., Redmond, WA ; Schulte, W.

Unit tests are becoming popular. Are there ways to automate the generation of good unit tests? Parameterized unit tests are unit tests that depend on inputs. PUTs describe behavior more concisely than traditional unit tests. We use symbolic execution techniques and constraint solving to find inputs for PUTs that achieve high code coverage, to turn existing unit tests into PUTs, and to generate entirely new PUTs that describe an existing implementation's behavior. Traditional testing benefits from these techniques because test inputs - including the behavior of entire classes - can often be generated automatically from compact PUTs

Published in:

Software, IEEE  (Volume:23 ,  Issue: 4 )

Date of Publication:

July-Aug. 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.