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A note on the complexity of reliability in neural networks

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3 Author(s)
Berman, P. ; Dept. of Comput. Sci., Pennsylvania State Univ., University Park, PA, USA ; Parberry, I. ; Schnitger, Georg

It is shown that in a standard discrete neural network model with small fan-in, tolerance to random malicious faults can be achieved with a log-linear increase in the number of neurons and a constant factor increase in parallel time, provided fan-in can increase arbitrarily. A similar result is obtained for a nonstandard but closely related model with no restriction on fan-in

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Neural Networks, IEEE Transactions on  (Volume:3 ,  Issue: 6 )