By Topic

Design of a novel soft error mitigation technique for reconfigurable architectures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Baloch, S. ; Sch. of Electron. & Eng., Edinburgh Univ. ; Arslan, T. ; Stoica, A.

Commercially off the shelf (COTS) available reconfigurable architectures are becoming popular for applications where high dependability, performance and low costs are mandatory constraints such as space applications. We present a unique SEE (single event effect) mitigation technique based upon temporal data sampling and weighted voting for synchronous circuits and configuration bit storage for reconfigurable architectures. The design technique addresses both conventional static SEUs (single event upsets) and SETs (single event transients) induced errors which result in data loss for reconfigurable architectures in space. The design technique not only eliminates all the single event upsets and single event transients but eliminates all double event upset as well

Published in:

Aerospace Conference, 2006 IEEE

Date of Conference:

0-0 0