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Testability Considerotions in Microprocessor-Based Design

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2 Author(s)
Hayes, J.P. ; University of Southern California ; McCluskey, E.J.

Microprocessors are difficult to test–many failure modes exist and access to internal components is limited. Design techniques that enhance testability can reduce the impact of these constraints.

Published in:

Computer  (Volume:13 ,  Issue: 3 )

Date of Publication:

March 1980

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