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Comments, with reply, on "Correlation of Arrhenius parameters: the electrotechnical aging compensation effect

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2 Author(s)
Montanari, G.C. ; Inst. d'Electrotech. Ind., Bologna Univ., Italy ; David, P.K.

The commenter makes three particular comments concerning the work of P.K. David (see ibid., vol. 22, p.229-236, 1987). They relate to: (1) the question of whether different properties should be related to aging process in different ways, so that degradation of one property is not as sensitive to aging reactions as for another property; (2) the problem of the common point of intersection in a family of life lines pertinent to different failure criteria; and (3) the theoretical background and development of David's theory. The author's discusses the commenters points further.<>

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Electrical Insulation, IEEE Transactions on  (Volume:23 ,  Issue: 6 )