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A localized trace element analysis of water trees in XLPE cable insulation by micro-PIXE and EDX

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6 Author(s)
Hinrichsen, P.F. ; Lab. de Phys. Nucl., Montreal Univ., Que., Canada ; Houdayer, A. ; Belhadfa, A. ; Crine, J.-P.
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PIXE (proton-induced X-ray emission) with a focused proton beam of 30-or 220- mu m diameter and EDX (energy dispersive X-ray analysis) of water-trees in XLPE HV (cross-linked polyethylene high-voltage) cable insulation. The merits of these two methods are compared and discussed. It is shown that water-trees are more contaminated than the surrounding insulation. On a localized basis the impurity content of the untreed insulation varies considerably within a few square millimeters.<>

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Electrical Insulation, IEEE Transactions on  (Volume:23 ,  Issue: 6 )