Cart (Loading....) | Create Account
Close category search window
 

Generation and Propagation of Single Event Transients in CMOS Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wirth, G.I. ; UERGS-State, RGS Univ., Guaiba ; Vieira, M.G. ; Neto, E.H. ; Kastensmidt, F.L.

The generation and the propagation of radiation induced single event transients (SET) in CMOS circuits are evaluated. An accurate and computer efficient analytical model for SET generation and propagation is proposed. The model allows the rapid determination of the sensitivity of any MOS circuit node to SET, without the need to run circuit level simulations. The model predicts whether or not a particle hit generates a transient pulse which may propagate to the next logic gate or memory element. Electrical masking of the transient pulse as it propagates through each stage of logic until it reaches a memory element is also modeled. The proposed approach is suitable for integration into CAD-tools, intending to make automated evaluation of circuit sensitivity to SEU possible

Published in:

Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE

Date of Conference:

18-21 April 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.