By Topic

Characterisation of nonlinear thin films using logarithmic Hilbert transform

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ozcan, A. ; Edward L. Ginzton Lab., Stanford Univ., CA, USA

A new technique based on logarithmic Hilbert transform processing of Maker-fringe curves to characterise second-order optical nonlinear depth profile of thin films is described and demonstrated experimentally. This technique, being analytical, is faster than its iterative alternative. This is the first time that a Hilbert transform based analytical tool has been applied to characterise nonlinear thin films.

Published in:

Electronics Letters  (Volume:42 ,  Issue: 11 )