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Characterisation of nonlinear thin films using logarithmic Hilbert transform

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1 Author(s)
Ozcan, A. ; Edward L. Ginzton Lab., Stanford Univ., CA, USA

A new technique based on logarithmic Hilbert transform processing of Maker-fringe curves to characterise second-order optical nonlinear depth profile of thin films is described and demonstrated experimentally. This technique, being analytical, is faster than its iterative alternative. This is the first time that a Hilbert transform based analytical tool has been applied to characterise nonlinear thin films.

Published in:

Electronics Letters  (Volume:42 ,  Issue: 11 )