By Topic

A high-speed 850-nm optical receiver front-end in 0.18-/spl mu/m CMOS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Hermans, C. ; ESAT-MICAS Lab., Katholieke Univ., Leuven ; Steyaert, M.S.J.

A high-speed optical interface circuit for 850-nm optical communication is presented. Photodetector, transimpedance amplifier (TIA), and post-amplifier are integrated in a standard 0.18-mum 1.8-V CMOS technology. To eliminate the slow substrate carriers, a differential n-well diode topology is used. Device simulations clarify the speed advantage of the proposed diode topology compared to other topologies, but also demonstrate the speed-responsivity tradeoff. Due to the lower responsivity, a very sensitive transimpedance amplifier is needed. At 500 Mb/s, an input power of -8 dBm is sufficient to have a bit error rate of 3middot10-10. Next, the design of a broadband post-amplifier is discussed. The small-signal frequency dependent gain of the traditional and modified Cherry-Hooper stage is analyzed. To achieve broadband operation in the output buffer, so-called "fT doublers" are used. For a differential 10 mVpp 231-1 pseudo random bit sequence, a bit error rate of 5middot10-12 at 3.5 Gb/s has been measured. At lower bit-rates, the bit error rate is even lower: a 1-Gb/s 10-mVpp input signal results in a bit error rate of 7middot10-14. The TIA consumes 17mW, while the post-amplifier circuit consumes 34 mW

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:41 ,  Issue: 7 )