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A tunable double-grating resonant leaky mode microelectromechanical-type element is introduced. A significant level of tunability is demonstrated by adjusting mechanically the structural symmetry of the grating profile. Tuning is also possible by variation of the thickness of the resonant layer. For a particular example silicon-on-insulator structure treated, it is shown that the resonance wavelength can be shifted by ∼300 nm with a horizontal movement of ∼120 nm within the 1.4-1.7-μm wavelength band. Additionally, the reflectance can be varied from ∼10-3 to 1 at central wavelength of 1.55 μm with a vertical movement of ∼200 nm. These results demonstrate new possibilities in design of tunable optical devices.