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Secondary electron yield measurements from materials with application to collectors of high-power microwave devices

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7 Author(s)
N. D. Zameroski ; Dept. of Electr. & Comput. Eng., New Mexico Univ., Albuquerque, NM, USA ; P. Kumar ; C. Watts ; T. Svimonishvili
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An experimental test facility has been established for measuring the secondary electron yield (SEY) of materials thought to be suitable for low yield vacuum electronic applications such as collectors in high-power microwave (HPM) tubes. Experiments can be broadly divided into two energy-regimes: a high-energy (1-50 keV) and a low-energy (10 eV-1 keV) regime. Measurements of SEY at high energies are presented for the following materials: copper, titanium, and Poco graphite. Observation of time-dependent SEY behavior in these samples suggests that surface processes play an important role during measurements. In addition, SEY at low energies and as a function of the angle of incidence of primary electrons has been measured for plasma sprayed boron carbide (PSBC). The experimental results presented here are benchmarked with existing SEY data in the literature, empirically and to first principle formulae

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IEEE Transactions on Plasma Science  (Volume:34 ,  Issue: 3 )