Cart (Loading....) | Create Account
Close category search window
 

A New Model to Simulate Critical Current Degradation of a Large CICC by Taking Into Account Strand Bending

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Koizumi, N. ; Japan Atomic Energy Agency, Ibaraki ; Nunoya, Y. ; Okuno, K.

The ITER model coil experiments have revealed that degradation of the critical current (Ic) and n index occurred in large Nb 3Sn CICC's and the larger the electromagnetic force, the larger was the degradation. However, such degradation was not observed in the Nb3Al CICC. The authors developed a new model, in which the degradation of the Ic and n index of an individual strand was taken into account, to interpret these results. Analytical model corrected from experimental results of a single strand is used in this model to estimate the degradation of each strand. The calculation results are in good agreement with the CICCs' test results. In addition, it is indicated that in case of the Nb3Sn CICC, the normal transition occurs from the strands at low field side in CICC cross section, where transverse load due to the electromagnetic force is the largest, resulting in the significant degradation in the Ic and the n index. In contrast, in the case of the Nb3Al CICC, the normal transition takes place from the strands at high field in the CICC cross section, where the transverse load is small, resulting in no degradation in the Ic and the n index

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:16 ,  Issue: 2 )

Date of Publication:

June 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.