Cart (Loading....) | Create Account
Close category search window
 

The power of 10: rules for developing safety-critical code

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Holzmann, G.J. ; JPL Lab. for Reliable Software, NASA Goddard Space Flight Center, Greenbelt, MD

Existing coding guidelines therefore offer limited benefit, even for critical applications. A verifiable set of well-chosen coding rules could, however, assist in analyzing critical software components for properties that go well beyond compliance with the set of rules itself. To be effective, though, the set of rules must be small, and it must be clear enough that users can easily understand and remember it. In addition, the rules must be specific enough that users can check them thoroughly and mechanically. To put an upper bound on the number of rules, the set is restricted to no more than 10 rules that will provide an effective guideline. Although such a small set of rules cannot be all-encompassing, following it can achieve measurable effects on software reliability and verifiability

Published in:

Computer  (Volume:39 ,  Issue: 6 )

Date of Publication:

June 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.