By Topic

Improved response of an active load emulation system by using a fuzzy inference system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

In this study, we propose a new approach to reconstruction of the remote sensing images degraded by an image formation system of limited spatial resolution and contaminated with noise. The proposed method employs the idea of combining the image reconstruction strategies with different regularization paradigms. On one hand, we propose to apply the maximum entropy (ME) statistical regularization paradigm for nonlinear image reconstruction, and on the other hand, we make use of the descriptive regularization paradigm of the variational analysis (VA) method to perform image post-processing aimed at the enhanced localization of the homogeneous image zones with edge preservation. The advantages of both the ME and VA regularization approaches are attained via aggregating these two strategies for image reconstruction and noise reduction into the new fused variational analysis maximum entropy (VAME) method for nonlinear reconstructive computational post-processing of the remote sensing imagery. We propose, also, an efficient scheme for computational implementation of the new VAME method that employs the iterative structure of the modified Hopfield-type neural network. The efficiency of the proposed VAME method is illustrated through computer simulations.

Published in:

Latin America Transactions, IEEE (Revista IEEE America Latina)  (Volume:3 ,  Issue: 4 )