By Topic

Reinforcement Matching Using Region Context

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Hongli Deng ; Oregon State University, USA ; Mortensen, E.N. ; Shapiro, L. ; Dietterich, T.G.

Local feature-based matching is robust to both clutter and occlusion. However, a primary shortcoming of local features is a deficiency of global information that can cause ambiguities in matching. Local features combined with global relationships convey much more information, but global spatial information is often not robust to occlusion and/or non-rigid transformations. This paper proposes a new framework for including global context information into local feature matching, while still maintaining robustness to occlusion, clutter, and nonrigid transformations. To generate global context information, we extend previous fixed-scale, circular-bin methods by using affine-invariant log-polar elliptical bins. Further, we employ a reinforcement matching scheme that provides greater robustness to occlusion and clutter than previous methods that non-discriminately compare accumulated bins values over the entire context. We also present a more robust method of calculating a feature’s dominant orientation. We compare reinforcement matching to nearest neighbor matching without region context and to robust matching methods (RANSAC and PROSAC).

Published in:

Computer Vision and Pattern Recognition Workshop, 2006. CVPRW '06. Conference on

Date of Conference:

17-22 June 2006