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The influence of light propagation direction on the stress-induced polarization dependence of silicon waveguides

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1 Author(s)
Min Huang ; Silicon Technol. Dev., Texas Instrum. Inc., Dallas, TX

This letter studies the effects of light propagation direction on the stress-induced polarization dependence of silicon-based waveguides. Silicon is an anisotropic material, so the stresses and the corresponding change of polarization dependence vary with the light propagation directions. The analyses show that when the light propagates in lang010rang directions on (100) silicon, the stress-induced changes of refractive index and the birefringence in effective index are about 20% more sensitive to the stresses than those when the light propagates in lang011rang directions

Published in:

Photonics Technology Letters, IEEE  (Volume:18 ,  Issue: 12 )