Cart (Loading....) | Create Account
Close category search window
 

Analysis of depth from defocus measurements for micro-imaging and 3D micro-visual reconstruction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Wei, Y. ; Micro & Nano Autom. Lab., Chinese Acad. of Sci., Beijing, China ; Zaili Dong ; Lei Miao ; Li, W.J.

Based on fuzzy measurement of microscopic optical images, analysis of the focused and defocused characteristics of the images was performed, and a method based on Depth from Defocus (DFD) is developed for micro scale image analysis and reconstruction. In this method, we use gradient operators as the measurement operator. With the establishment of relationship between the defocus measurement and the depth transformation of the micro image sequence, we obtained the depth information of the target-object. As a test of validity of our method, we also performed an experiment to measure the parallelism of a micro manipulation platform. In additional, we also reconstructed micro contour images using the DFD method and the experiment results showed that the method is valid for 3D reconstruction of microscope images.

Published in:

Information Acquisition, 2005 IEEE International Conference on

Date of Conference:

27 June-3 July 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.