By Topic

Nanometer scale resolution luminescence imaging of quantum wire structure with a scanning tunneling microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

7 Author(s)
Renaud, P. ; IBM Zurich Res. Lab., Ruschlikon ; Alvarado, S.F. ; Marti, U. ; Reinhart, F.K.
more authors

Summary form only given. The potential of the STM (scanning tunneling microscope) technique for the characterization of quantum wire structures is demonstrated experimentally. These measurements have the unique feature of locally controlling the electron injection and of inducing luminescence within a single quantum wire. Thus local electronical information is obtained independently of the rest of the sample. This opens up a new way for wire-by-wire characterization of quantum wire arrays and may become of great help for the fabrication of high-quality samples

Published in:

Electron Devices, IEEE Transactions on  (Volume:39 ,  Issue: 11 )