Referenced Items are not available for this document.
Summary form only given. The potential of the STM (scanning tunneling microscope) technique for the characterization of quantum wire structures is demonstrated experimentally. These measurements have the unique feature of locally controlling the electron injection and of inducing luminescence within a single quantum wire. Thus local electronical information is obtained independently of the rest of the sample. This opens up a new way for wire-by-wire characterization of quantum wire arrays and may become of great help for the fabrication of high-quality samples
Published in:
Electron Devices, IEEE Transactions on
(Volume:39
,
Issue:
11
)
Date of Publication: Nov 1992
- Page(s):
- 2644 - 2645
- ISSN :
- 0018-9383
- INSPEC Accession Number:
- 4338335
- Digital Object Identifier :
- 10.1109/16.163495
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Nov 1992
- Sponsored by :
- IEEE Electron Devices Society
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