Cart (Loading....) | Create Account
Close category search window

Robust H filtering for discrete-time linear systems with uncertain time-varying parameters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
de Souza, Carlos E. ; Dept. of Syst. & Control, Petropolis, Brazil ; Barbosa, K.A. ; Neto, A.T.

This paper deals with the problem of robust H filtering for linear discrete-time state-space models with uncertain time-varying parameters. The parameters enter affinely into the state-space model matrices, and their admissible values and variations are assumed to belong to given intervals. A method is derived for designing a linear stationary asymptotically stable filter with a prescribed H performance, in spite of large parameter uncertainty. The proposed method incorporates information on available bounds on both the admissible values and variation of the uncertain parameters and is based on a Lyapunov function with quadratic dependence on the parameters. The filter design is given in terms of linear matrix inequalities.

Published in:

Signal Processing, IEEE Transactions on  (Volume:54 ,  Issue: 6 )

Date of Publication:

June 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.