Cart (Loading....) | Create Account
Close category search window

In-Register Duplication: Exploiting Narrow-Width Value for Improving Register File Reliability

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jie Hu ; Dept. of Electr. & Comput. Eng., New Jersey Inst. of Technol., Newark, NJ ; Shuai Wang ; Ziavras, S.G.

Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to soft errors induced by high-energy particle strikes. Since the register file is in the critical path of the processor pipeline, any reliable design that increases either the pressure on the register file or the register file access latency is not desirable. In this paper, we propose to exploit narrow-width register values, which present the majority of the generated values, for duplicating a copy of the value within the same data item, called in-register duplication (IRD), eliminating the requirement of additional copy registers. The datapath pipeline is augmented to efficiently incorporate parity encoding and parity checking such that error recovery is seamlessly supported in IRD and the parity checking is overlapped with the execution stage to avoid increasing the critical path. Our experimental evaluation using the SPEC CINT2000 benchmark suite shows that IRD provides superior read-with-duplicate (RWD) and error detection/recovery rates under heavy error injection as compared to previous reliability schemes

Published in:

Dependable Systems and Networks, 2006. DSN 2006. International Conference on

Date of Conference:

25-28 June 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.