By Topic

Exploring Fault-Tolerant Network-on-Chip Architectures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Dongkook Park ; Dept. of Comput. Sci. & Eng., Pennsylvania State Univ., University Park, PA ; Nicopoulos, C. ; Jongman Kim ; Vijaykrishnan, N.
more authors

The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are rapidly becoming a force to be reckoned with. This spiraling trend highlights the importance of detailed analysis of these reliability hazards and the incorporation of comprehensive protection measures into all network-on-chip (NoC) designs. In this paper, we examine the impact of transient failures on the reliability of on-chip interconnects and develop comprehensive counter-measures to either prevent or recover from them. In this regard, we propose several novel schemes to remedy various kinds of soft error symptoms, while keeping area and power overhead at a minimum. Our proposed solutions are architected to fully exploit the available infrastructures in an NoC and enable versatile reuse of valuable resources. The effectiveness of the proposed techniques has been validated using a cycle-accurate simulator

Published in:

Dependable Systems and Networks, 2006. DSN 2006. International Conference on

Date of Conference:

25-28 June 2006