Cart (Loading....) | Create Account
Close category search window
 

Out of step relaying using phasor measurement unit and equal area criterion

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bozchalui, M.C. ; Sch. of Electr. & Comput. Eng., Tehran Univ. ; Sanaye-Pasand, M.

Significant changes of load as well as faults and their clearance in power systems, which disturb balance of energy in the system, often result in electromechanical oscillations. This causes variation in power flow between two areas which is usually called as power swing. An effective way to retaliate such a disturbance is through controlled islanding of the power system using out of step (OOS) protection systems. In this paper we use a method which is based on the well-known equal area criterion (EAC) and application of phasor measurement units to protect interconnected systems against loss of synchronism. System oscillation is modeled using the mth-order auto regressive model. Afterwards, using the phase difference values stability of the power system is determined using the equal area criterion

Published in:

Power India Conference, 2006 IEEE

Date of Conference:

0-0 0

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.