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A framework to evaluate technology and device design enhancements for MOS integrated circuits

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3 Author(s)
Sodini, C.G. ; Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA ; Wong, S.S. ; Ko, P.-K.

A hierarchical framework which connects device and technology design parameters to specific circuit applications is presented. The functional circuit blocks which are used in the framework are defined. Examples of the use of this framework for design-intensive circuits are given, and experimental data which show the impact of device design on these circuit applications are presented. Technology-intensive circuit examples are also given which demonstrate the effect of technology enhancements on specific circuit applications.<>

Published in:

Solid-State Circuits, IEEE Journal of  (Volume:24 ,  Issue: 1 )