Cart (Loading....) | Create Account
Close category search window
 

High-order electromechanical ΣΔ modulation in micromachined inertial sensors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Petkov, V.P. ; Berkeley Sensor & Actuator Center, Univ. of California, Berkeley, CA, USA ; Boser, B.E.

Analysis of second-order electromechanical sigma-delta (ΣΔ) inertial sensors shows that in-band quantization error introduces a resolution penalty, which cannot be eliminated by oversampling. In addition, a tradeoff between resolution and phase compensation forces such systems to operate with reduced phase margin. This paper introduces high-order electromechanical ΣΔ modulation as an approach, which eliminates the quantization noise overhead and allows for increased phase compensation without degrading the resolution. Quasi-linear analysis is used to evaluate the contribution of the individual noise sources to the output of the system and to examine the effect of noise interaction on the behavior of electromechanical ΣΔ modulators.

Published in:

Circuits and Systems I: Regular Papers, IEEE Transactions on  (Volume:53 ,  Issue: 5 )

Date of Publication:

May 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.