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Intelligent prognostics system design and implementation

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4 Author(s)
Yu-Chuan Su ; Inst. of Manuf. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan ; Fan-Tien Cheng ; Min-Hsiung Hung ; Hsien-Cheng Huang

This paper proposes an intelligent prognostics system JPS) for semiconductor and TFT-LCD manufacturing. The IPS comprises several generic embedded devices (GEDs) and remote clients. The GED can be easily embedded into various types of equipment to acquire equipment engineering data and meet the specification requirements of Interface A for supporting semiconductor industry equipment engineering capabilities. Furthermore, the GED has an open-standard application interface offering pluggable and customized intelligent applications. With this feature, the intelligent applications can be distributed and localized, releasing the factory network burden and enhancing equipment reliability and processing quality. This paper also develops two typical pluggable applications: the predictive maintenance scheme (PMS) for detecting equipment faults and the virtual metrology scheme (VMS) for conjecturing equipment-processing quality. Integrating the PMS into the IPS and the VMS into the IPS are, respectively, accomplished using the conveyor equipment and the sputtering equipment in a TFT-LCD factory. These two illustrative examples clearly demonstrate that IPS is versatile, configurable, and effective.

Published in:
Semiconductor Manufacturing, IEEE Transactions on  (Volume:19 ,  Issue: 2 )

Date of Publication: May 2006

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