We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Concurrent detection of erroneous responses in linear analog circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Stratigopoulos, H.-G.D. ; Dept. of Electr. Eng., Yale Univ., New Haven, CT, USA ; Makris, Y.

This paper presents a novel methodology for concurrent error detection in linear analog circuits. The error-detection circuit monitors the input and some observable internal nodes of the examined circuit and generates an estimate of its output. The estimate coincides with the output in error-free operation, while in the presence of errors, it diverges. Thus, concurrent error detection is performed by comparing the two signals through an analog comparator. In essence, the error-detection circuit operates as a duplicate of the examined circuit, yet it is smaller, in general, and never exceeds the size of an actual duplicate. The proposed methodology is demonstrated on three analog filters.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:25 ,  Issue: 5 )