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Proton damage effects in high performance P-channel CCDs

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7 Author(s)
Spratt, J.P. ; Full Circle Res. Inc., Redondo Beach, CA, USA ; Conger, C. ; Bredthauer, R. ; Byers, W.
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P-channel CCDs with pre-rad imaging characteristics comparable to the best N-channel CCDs have been fabricated and tested. These devices have been subjected to proton damage and display the superior hardness predicted for them.

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Nuclear Science, IEEE Transactions on  (Volume:53 ,  Issue: 2 )