Cart (Loading....) | Create Account
Close category search window
 

Tissue sensing adaptive Radar for breast cancer detection-investigations of an improved skin-sensing method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Williams, T.C. ; Electr. & Comput. Eng., Calgary Univ., Alta., Canada ; Fear, E.C. ; Westwick, D.T.

Active microwave breast imaging is being researched as a supplement to current breast imaging modalities. Ultra-wideband radar approaches involve analyzing reflections from the breast to identify the presence of tumors. Skin sensing, which involves estimating the location and thickness of the skin, is a key step in this process, as the reflections from the skin dominate the signal. Current methods employing a rudimentary peak detection process estimate the location of the breast with acceptable accuracy. However, estimates of skin thickness in the range of 1.0-2.0 mm have unacceptable error. A method using deconvolution to obtain the impulse response of a scattering object is investigated to improve the performance of the skin-sensing algorithm. The new method employs a calibration step using a perfect electric conductor. Application to simulated data shows success in reducing the error percentage in both breast skin location and thickness estimates by more than half.

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:54 ,  Issue: 4 )

Date of Publication:

June 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.