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X-IDDQ: a novel defect detection technique using IDDQ data

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3 Author(s)
Sharma, A. ; Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA ; Jayasumana, A.P. ; Malaiya, Y.K.

A statistical technique X-IDDQ for extracting defect information from IDDQ data is presented that is effective for detection of defects in ICs. The technique treats the IDDQ measurements in a holistic manner to come up with a statistic X that is highly correlated to the presence of defects. X-IDDQ facilitates binning of ICs and enhances the test process by early identification of faults. The transformation metrics, for evaluating X statistic from IDDQ measurements, obtained using one batch works extremely well for different batches, facilitating its use with manufacturing-line testing.

Published in:

VLSI Test Symposium, 2006. Proceedings. 24th IEEE

Date of Conference:

30 April-4 May 2006