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Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects

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1 Author(s)
Nigh, P. ; IBM Microelectronics

Guest editor Phil Nigh introduces the Special Issue on Latent-Defect Screening as he explores the difficulties of current methods and calls for new solutions.

Published in:

Design & Test of Computers, IEEE  (Volume:23 ,  Issue: 2 )